panic - sleeping thread on FreeBSD 8.0-stable / amd64

Torfinn Ingolfsen torfinn.ingolfsen at broadpark.no
Sat Feb 20 21:50:04 UTC 2010


On Sat, 20 Feb 2010 11:37:18 -0800
Jeremy Chadwick <freebsd at jdc.parodius.com> wrote:

> Can you re-run smartctl -a instead of -H?  Some of the SMART attributes
> may help determine what's going on, or there may be related errors in
> the SMART error log.

smartctl -a output attached. Test sequence: ad4 - ad12, ada0.

> Otherwise I'd say what's happening is a SATA controller lock-up of some
> sort, since it happens on any of your channels.  Could be a quirk of
> some kind in the SATA->CAM stuff (unless it also happens when using pure
> ata(4)).

I am running a quite recent 8.0-stable:
root at kg-f2# uname -a
FreeBSD kg-f2.kg4.no 8.0-STABLE FreeBSD 8.0-STABLE #2: Sun Jan 31 18:39:17 CET 2010     root at kg-f2.kg4.no:/usr/obj/usr/src/sys/GENERIC  amd64

Perhaps I should upgrade.

> What controller are these disks hooked to again?

Six  of the disks (ad4, ad6, ad8, ad10, ad12) are connected to the SATA ports on the motherboard:
root at kg-f2# pciconf -lv | grep ata -A 4
atapci0 at pci0:0:17:0:	class=0x010601 card=0xb0021458 chip=0x43911002 rev=0x00 hdr=0x00
    vendor     = 'ATI Technologies Inc. / Advanced Micro Devices, Inc.'
    device     = 'SB700 SATA Controller [AHCI mode]'
    class      = mass storage
    subclass   = SATA
--
atapci1 at pci0:0:20:1:	class=0x01018a card=0x50021458 chip=0x439c1002 rev=0x00 hdr=0x00
    vendor     = 'ATI Technologies Inc. / Advanced Micro Devices, Inc.'
    device     = 'PATA 133 Controller (SB7xx)'
    class      = mass storage
    subclass   = ATA
(There is nothing connected to the PATA ports).

The last disk (ada0) is connected to a PCI card:
oot at kg-f2# pciconf -lv | grep siis -A 3
siis0 at pci0:2:0:0:	class=0x018000 card=0x35311095 chip=0x35311095 rev=0x01 hdr=0x00
    vendor     = 'Silicon Image Inc (Was: CMD Technology Inc)'
    device     = 'SiI 3531 SATA Controller'
    class      = mass storage


Hardware info about the machine here:
http://sites.google.com/site/tingox/ga-ma74gm-s2h

HTH
-- 
Torfinn

-------------- next part --------------
smartctl 5.39 2009-12-09 r2995 [FreeBSD 8.0-STABLE amd64] (local build)
Copyright (C) 2002-9 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     SAMSUNG SpinPoint F1 DT series
Device Model:     SAMSUNG HD252HJ
Serial Number:    S17HJ9BSA04283
Firmware Version: 1AC01118
User Capacity:    250,059,350,016 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 3b
Local Time is:    Sat Feb 20 22:44:11 2010 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		 (3651) seconds.
Offline data collection
capabilities: 			 (0x7b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 (  62) minutes.
Conveyance self-test routine
recommended polling time: 	 (   8) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   100   100   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0007   092   092   011    Pre-fail  Always       -       3260
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       21
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   253   253   051    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0025   100   100   015    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       1705
 10 Spin_Retry_Count        0x0033   100   100   051    Pre-fail  Always       -       0
 11 Calibration_Retry_Count 0x0012   100   100   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       21
 13 Read_Soft_Error_Rate    0x000e   100   100   000    Old_age   Always       -       0
183 Runtime_Bad_Block       0x0032   100   100   000    Old_age   Always       -       0
184 End-to-End_Error        0x0033   100   100   000    Pre-fail  Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
188 Command_Timeout         0x0032   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0022   068   064   000    Old_age   Always       -       32 (Lifetime Min/Max 21/32)
194 Temperature_Celsius     0x0022   065   062   000    Old_age   Always       -       35 (Lifetime Min/Max 21/35)
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   Always       -       932
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   100   100   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x000a   100   100   000    Old_age   Always       -       0
201 Soft_Read_Error_Rate    0x000a   253   253   000    Old_age   Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

smartctl 5.39 2009-12-09 r2995 [FreeBSD 8.0-STABLE amd64] (local build)
Copyright (C) 2002-9 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     SAMSUNG SpinPoint F1 DT series
Device Model:     SAMSUNG HD252HJ
Serial Number:    S17HJ9BSA04051
Firmware Version: 1AC01118
User Capacity:    250,059,350,016 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 3b
Local Time is:    Sat Feb 20 22:44:20 2010 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		 (3763) seconds.
Offline data collection
capabilities: 			 (0x7b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 (  64) minutes.
Conveyance self-test routine
recommended polling time: 	 (   8) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   100   100   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0007   092   092   011    Pre-fail  Always       -       3380
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       21
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   253   253   051    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0025   100   100   015    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       1705
 10 Spin_Retry_Count        0x0033   100   100   051    Pre-fail  Always       -       0
 11 Calibration_Retry_Count 0x0012   100   100   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       21
 13 Read_Soft_Error_Rate    0x000e   100   100   000    Old_age   Always       -       0
183 Runtime_Bad_Block       0x0032   100   100   000    Old_age   Always       -       0
184 End-to-End_Error        0x0033   100   100   000    Pre-fail  Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
188 Command_Timeout         0x0032   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0022   069   064   000    Old_age   Always       -       31 (Lifetime Min/Max 22/31)
194 Temperature_Celsius     0x0022   066   063   000    Old_age   Always       -       34 (Lifetime Min/Max 22/34)
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   Always       -       1337
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   100   100   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x000a   100   100   000    Old_age   Always       -       0
201 Soft_Read_Error_Rate    0x000a   253   253   000    Old_age   Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

smartctl 5.39 2009-12-09 r2995 [FreeBSD 8.0-STABLE amd64] (local build)
Copyright (C) 2002-9 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Device Model:     SAMSUNG HD103SJ
Serial Number:    S246J1KSB01853
Firmware Version: 1AJ100E4
User Capacity:    1,000,204,886,016 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 6
Local Time is:    Sat Feb 20 22:44:35 2010 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		 (9120) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 152) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   252   252   051    Pre-fail  Always       -       0
  2 Throughput_Performance  0x0026   252   252   000    Old_age   Always       -       0
  3 Spin_Up_Time            0x0023   073   073   025    Pre-fail  Always       -       8226
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       11
  5 Reallocated_Sector_Ct   0x0033   252   252   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002e   252   252   051    Old_age   Always       -       0
  8 Seek_Time_Performance   0x0024   252   252   015    Old_age   Offline      -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       1679
 10 Spin_Retry_Count        0x0032   252   252   051    Old_age   Always       -       0
 11 Calibration_Retry_Count 0x0032   252   252   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       12
191 G-Sense_Error_Rate      0x0022   100   100   000    Old_age   Always       -       1
192 Power-Off_Retract_Count 0x0022   252   252   000    Old_age   Always       -       0
194 Temperature_Celsius     0x0002   063   061   000    Old_age   Always       -       37 (Lifetime Min/Max 26/39)
195 Hardware_ECC_Recovered  0x003a   252   252   000    Old_age   Always       -       0
196 Reallocated_Event_Count 0x0032   252   252   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   252   252   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   252   252   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0036   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x002a   252   252   000    Old_age   Always       -       0
223 Load_Retry_Count        0x0032   252   252   000    Old_age   Always       -       0
225 Load_Cycle_Count        0x0032   100   100   000    Old_age   Always       -       12

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Completed [00% left] (0-65535)
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

smartctl 5.39 2009-12-09 r2995 [FreeBSD 8.0-STABLE amd64] (local build)
Copyright (C) 2002-9 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Device Model:     SAMSUNG HD103SJ
Serial Number:    S246J1KSB01864
Firmware Version: 1AJ100E4
User Capacity:    1,000,204,886,016 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 6
Local Time is:    Sat Feb 20 22:44:45 2010 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		 (9300) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 155) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   252   252   051    Pre-fail  Always       -       0
  2 Throughput_Performance  0x0026   252   252   000    Old_age   Always       -       0
  3 Spin_Up_Time            0x0023   073   073   025    Pre-fail  Always       -       8253
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       26
  5 Reallocated_Sector_Ct   0x0033   252   252   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002e   252   252   051    Old_age   Always       -       0
  8 Seek_Time_Performance   0x0024   252   252   015    Old_age   Offline      -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       1677
 10 Spin_Retry_Count        0x0032   252   252   051    Old_age   Always       -       0
 11 Calibration_Retry_Count 0x0032   252   252   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       27
191 G-Sense_Error_Rate      0x0022   252   252   000    Old_age   Always       -       0
192 Power-Off_Retract_Count 0x0022   252   252   000    Old_age   Always       -       0
194 Temperature_Celsius     0x0002   063   060   000    Old_age   Always       -       37 (Lifetime Min/Max 26/40)
195 Hardware_ECC_Recovered  0x003a   252   252   000    Old_age   Always       -       0
196 Reallocated_Event_Count 0x0032   252   252   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   252   252   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   252   252   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0036   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x002a   252   252   000    Old_age   Always       -       0
223 Load_Retry_Count        0x0032   252   252   000    Old_age   Always       -       0
225 Load_Cycle_Count        0x0032   100   100   000    Old_age   Always       -       27

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Completed [00% left] (0-65535)
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

smartctl 5.39 2009-12-09 r2995 [FreeBSD 8.0-STABLE amd64] (local build)
Copyright (C) 2002-9 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Device Model:     SAMSUNG HD103SJ
Serial Number:    S246J1KSB01865
Firmware Version: 1AJ100E4
User Capacity:    1,000,204,886,016 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 6
Local Time is:    Sat Feb 20 22:44:57 2010 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		 (9540) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 159) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   252   252   051    Pre-fail  Always       -       0
  2 Throughput_Performance  0x0026   252   252   000    Old_age   Always       -       0
  3 Spin_Up_Time            0x0023   073   073   025    Pre-fail  Always       -       8213
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       26
  5 Reallocated_Sector_Ct   0x0033   252   252   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002e   252   252   051    Old_age   Always       -       0
  8 Seek_Time_Performance   0x0024   252   252   015    Old_age   Offline      -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       1676
 10 Spin_Retry_Count        0x0032   252   252   051    Old_age   Always       -       0
 11 Calibration_Retry_Count 0x0032   252   252   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       27
191 G-Sense_Error_Rate      0x0022   252   252   000    Old_age   Always       -       0
192 Power-Off_Retract_Count 0x0022   252   252   000    Old_age   Always       -       0
194 Temperature_Celsius     0x0002   064   062   000    Old_age   Always       -       35 (Lifetime Min/Max 25/38)
195 Hardware_ECC_Recovered  0x003a   252   252   000    Old_age   Always       -       0
196 Reallocated_Event_Count 0x0032   252   252   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   252   252   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   252   252   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0036   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x002a   252   252   000    Old_age   Always       -       0
223 Load_Retry_Count        0x0032   252   252   000    Old_age   Always       -       0
225 Load_Cycle_Count        0x0032   100   100   000    Old_age   Always       -       27

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Completed [00% left] (0-65535)
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

smartctl 5.39 2009-12-09 r2995 [FreeBSD 8.0-STABLE amd64] (local build)
Copyright (C) 2002-9 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Device Model:     SAMSUNG HD103SJ
Serial Number:    S246J1KSB01867
Firmware Version: 1AJ100E4
User Capacity:    1,000,204,886,016 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 6
Local Time is:    Sat Feb 20 22:45:10 2010 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		 (9420) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 157) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   252   252   051    Pre-fail  Always       -       0
  2 Throughput_Performance  0x0026   252   252   000    Old_age   Always       -       0
  3 Spin_Up_Time            0x0023   073   073   025    Pre-fail  Always       -       8183
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       8
  5 Reallocated_Sector_Ct   0x0033   252   252   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002e   252   252   051    Old_age   Always       -       0
  8 Seek_Time_Performance   0x0024   252   252   015    Old_age   Offline      -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       1679
 10 Spin_Retry_Count        0x0032   252   252   051    Old_age   Always       -       0
 11 Calibration_Retry_Count 0x0032   252   252   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       12
191 G-Sense_Error_Rate      0x0022   100   100   000    Old_age   Always       -       1
192 Power-Off_Retract_Count 0x0022   252   252   000    Old_age   Always       -       0
194 Temperature_Celsius     0x0002   064   064   000    Old_age   Always       -       33 (Lifetime Min/Max 22/35)
195 Hardware_ECC_Recovered  0x003a   252   252   000    Old_age   Always       -       0
196 Reallocated_Event_Count 0x0032   252   252   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   252   252   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   252   252   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0036   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x002a   252   252   000    Old_age   Always       -       0
223 Load_Retry_Count        0x0032   252   252   000    Old_age   Always       -       0
225 Load_Cycle_Count        0x0032   100   100   000    Old_age   Always       -       12

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Completed [00% left] (0-65535)
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.



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