Sio & Puc memory mapped
Roman Kurakin
rik at cronyx.ru
Fri May 14 14:22:48 PDT 2004
http://www.cronyx.ru/~rik/aiotest.tgz
http://www.cronyx.ru/~rik/asytest.tgz
Roman Kurakin пишет:
> Marcel Moolenaar wrote:
>
>> On Fri, May 14, 2004 at 07:16:27PM +0400, Roman Kurakin wrote:
>>
>> *snip*
>>
>>
>>> I don't have any other cards supported by uart(4), so I can't test
>>> it by my self. If you have a time and ability, I'll send these tests
>>> for you.
>>>
>>
>> Love to. I can take a look at it this weekend. If the tests aren't
>> self-explanatory, could you add a small note about what they are
>> supposed to test and if not obvious, what their expected outcome is?
>>
>>
> If you get an error or test freeze this would be bad.
> The only problem that could be - "break test" should fail.
> Other tests should pass.
>
> I doesn't use break test, so I put off to find out why this part
> is broken.
>
> Usage:
> aiotest [-spmfb] device1 device2
> Options:
> -s speed test
> -p parity test
> -m pmodem signals test
> -f flow control test
> -b break test
>
> This test tests two ports. You need a full null-mode cable for it.
>
> Usage:
> asytest [-b baud] [-p pattern] device...
> Options:
> -b # data rate, default 115200 bits/sec
> -p [12] pattern, default 1
> 1 0xAA/0x55
> 2 random
>
> This is single port test. You need a loop for it. You may run two tests
> for two connected to each other ports, but in that case I would unable
> to use random pattern. On linux 2.6 serial driver test with constant
> pattern works almost fine, but with random shows how it is buggy.
>
> rik
>
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>
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